Impurities, Defects and Diffusion in Semiconductors: Bulk and Layered Structures: Volume 163

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. INDICE: Preface; Acknowledgments; Materials Research Society symposium proceedings; Part I. Electronic Structure - Deep Levels; Part II. Electronic Structure - Shallow Impurities; Part III. Electronic Structures - Native Defects, Complexes, Transition Metals in Compounds; Part IV. Electronic Structure - Complexes in Silicon; Part V. Electronic Structure - Superlattices; Part VI. Hydrogen in Silicon; Part VII. Hydrogen in III-Vs; Part VIII. Diffusion in Silicon and Germanium; Part IX. Diffusion in Compounds; Part X. Diffusion in Superlattices; Part XI. DX Centers; Part XII. EL2 Centers; Part XIII. Doping in III-Vs; Part XIV. Ordering in Alloys; Part XV. Processing of Silicon and Germanium; Part XI. Processing of Compounds; Author index; Subject index.

• ISBN: 978-1-107-41030-5
• Editorial: Cambridge University Press
• Encuadernacion: Rústica
• Páginas: 1086
• Fecha Publicación: 05/06/2014
• Nº Volúmenes: 1
• Idioma: Inglés