This book will provide a broad but detailed view of Electrical Overstress in semiconductor devices, with a focus on integrated circuit and discrete devices. It will equip the reader with the understanding needed to address EOS damage seen in their work environment and help them identify and correct the sources of EOS damage.
- ISBN: 978-1-4419-8778-5
- Editorial: Springer
- Encuadernacion: Cartoné
- Fecha Publicación: 08/07/2015
- Nº Volúmenes: 1
- Idioma: Inglés