Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance

Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance

van Schooten, Kipp

103,99 €(IVA inc.)
  • ISBN: 978-3-319-03328-0
  • Editorial: Springer
  • Encuadernacion: Rústica
  • Fecha Publicación: 09/08/2015
  • Nº Volúmenes: 1
  • Idioma: Inglés