Test and diagnosis for small-delay defects

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies forscreening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects. Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and noise-aware methodologies. Shows readers to use timing information for small-delay defect diagnosis, in order to increase the resolution of their current diagnosis flow. INDICE: Introduction to VLSI Testing. Delay Test and System-Delay Defects.Long Path-Based Hybrid Method. Process Variations- and Crosstalk-Aware Pattern Selection. Power Supply Noise- and Crosstalk-Aware Hybrid Method. SDD-Based Hybrid Method. Maximizing Crosstalk Effect on Critical Paths. Maximizing PowerSupply Noise on Critical Paths. Faster-than-at-speed Test. Introduction to Diagnosis. Diagnosing Noise-Induced SDDs by Using Dynamic SDF.

• ISBN: 978-1-4419-8296-4
• Editorial: Springer New York
• Encuadernacion: Cartoné
• Páginas: 212
• Fecha Publicación: 28/10/2011
• Nº Volúmenes: 1
• Idioma: Inglés