Understanding Faults: Detecting, Dating, and Modeling

Understanding Faults: Detecting, Dating, and Modeling offers a single resource for analyzing faults for a variety of applications, from hazard detection and earthquake processes, to geophysical exploration. The book presents the latest research, including fault dating using new mineral growth, fault reactivation, and fault modeling, and also helps bridge the gap between geologists and geophysicists working across fault-related disciplines. Using diagrams, formulae, and worldwide case studies to illustrate concepts, the book provides geoscientists and industry experts in oil and gas with a valuable reference for detecting, modeling, analyzing and dating faults. Presents cutting-edge information relating to fault analysis, including mechanical, geometrical and numerical models, theory and methodologiesIncludes formulae on 3D fault growth rates, expansion indexes of growth faults, and calculations of fault sealing capabilitiesDescribes how faults are detected, what fault models predict, and techniques for dating fault movementUtilizes worldwide case studies throughout the book to concretely illustrate key concepts INDICE: Chapter 1: Introduction David C. Tanner, Christian Brandes Chapter 2: Fault Mechanics and Earthquakes Christian Brandes, David C. Tanner Chapter 3: Fault Detection David C. Tanner Hermann Buness, Jan Igel, Thomas Günther, Gerald Gabriel, Peter Skiba, Thomas Plenefisch, Nicolai Gestermann, Thomas R. Walter Chapter 4: Numerical Modelling of Faults Andreas Henk Chapter 5: Faults in the Laboratory André R. Niemeijer, ?ke Fagereng, Matt Ikari, Stefan Nielsen, Ernst Willingshofer Chapter 6: The Growth Fault Andrew Nicol, Conrad Childs, John Walsh, Tom Manzocchi Chapter 7: Direct dating of fault movement Sumiko Tsukamoto, Takahiro Tagami, Horst Zwingmann Chapter 8: Fault seal Michael Kettermann, Luca Smeraglia, Chris Morley, Christoph von Hagke, David C. Tanner Chapter 9: Conclusions David C. Tanner, Christian Brandes

• ISBN: 978-0-12-815985-9
• Editorial: Elsevier
• Encuadernacion: Rústica
• Páginas: 350
• Fecha Publicación: 01/10/2019
• Nº Volúmenes: 1
• Idioma: Inglés