Structural dynamics of electronic and photonic systems

conducted to the key components’ level as well as the whole device level. Both theoretical (analytical and computer-aided) and experimental methods of analysis will be addressed. The authors will identify how the failure control parameters (e.g. displacement, strain and stress) of the vulnerable components maybe affected by the external vibration or shock loading, as well as by the internal parameters of the infrastructure of the device. Guidelines for material selection, effective protection and test methods will be developed for engineering practice.

• ISBN: 978-0-470-25002-0
• Editorial: John Wiley & Sons
• Encuadernacion: Cartoné
• Páginas: 624
• Fecha Publicación: 19/01/2011
• Nº Volúmenes: 1
• Idioma: Inglés