Reliability wearout mechanisms in advanced CMOS technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies is both a text and a reference work. It assumes no reliability education or experience. It is also the first reference book with all of the relevant physics, equations, andprocedures for CMOS technology reliability in one place The book is divided into five parts. The first part is an introduction to reliability and to the statistics required for reliability analysis. The next three parts: Dielectric Reliability, Device Reliability, and Interconnect Reliability each include a historical perspective and the fundamental reliability physics before providing coverage of the reliabilty mechanisms and the physics associated with them. This framework is used to expand into building the bridge between the physics ofthe accelerated mechanisms and the mechansims that the product will experience. The current state of the art and the significance of the mechanisms in the future are covered in the final chapters of each part. The final part on Product Reliability is organized differently, it provides a description of the how the various mechanisms impact the circuit design.

• ISBN: 978-0-471-73172-6
• Editorial: John Wiley & Sons
• Encuadernacion: Cartoné
• Páginas: 640
• Fecha Publicación: 04/09/2009
• Nº Volúmenes: 1
• Idioma: Inglés