Reliability of Nanoscale Circuits and Systems

This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.

• ISBN: 978-1-4899-8254-4
• Editorial: Springer
• Encuadernacion: Rústica
• Fecha Publicación: 11/10/2014
• Nº Volúmenes: 1
• Idioma: Inglés