This book explains the problem of estimating statistics of memory performancevariation induced due to IC manufacturing process variations, and provides solutions recently proposed in the Electronic Design Automation (EDA) community.The material serves as a comprehensive reference for researchers and practitioners interested in the problem of estimating extreme statistics for memories.Includes a treatment of memory design from the perspective of statistical analysis Covers relevant theoretical background from other fields: statistics, machine learning, optimization, reliability Explains the problem of estimating statistics of memory performance variation Shows solutions recently proposed inthe Electronic Design Automation (EDA) community Contains chapters contributed from both industry and academia INDICE: Introduction.- Extreme Statistics in Memories.- Statistical Nano CMOS Variability and its Impact on SRAM.- Importance Sampling-Based Estimation:Applications to Memory Design.- Direct SRAM Operation Margin Computation withRandom Skews of Device Characteristics.- Yield Estimation by Computing Probabilistic Hypervolumes.- Most Probable Point Based Methods.- Extreme Value Theory: Application to Memory Statistics
- ISBN: 978-1-4419-6605-6
- Editorial: Springer
- Encuadernacion: Cartoné
- Páginas: 258
- Fecha Publicación: 29/09/2010
- Nº Volúmenes: 1
- Idioma: Inglés