Characterization of microstructures by analyticalelectron microscopy (AEM)

"Characterization of Microstructures by Analytical Electron Microscopy (AEM)"describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. The book is intended for researchers and graduate students in materials science andengineering, and condensed matter physics. Yonghua Rong is a professor at School of Materials Science and Engineering, Shanghai Jiao Tong University, China. INDICE: The Analytical Electron Microscope (AEM).- Specimen Preparation.- Electron Diffraction.- Mathematics Analysis in Electron Diffraction and Crystallography.- Diffraction Contrast.- High Resolution and High Spatial Resolutionof Analytical Electron Microscopy.

• ISBN: 978-3-642-20118-9
• Editorial: Springer
• Encuadernacion: Cartoné
• Fecha Publicación: 05/03/2012
• Nº Volúmenes: 1
• Idioma: Inglés