Rare-earth implanted MOS structures: microstructural, electrical and optoelectronic properties

The book concentrates on the microstructural, electric and optoelectronic properties of rare-earth implanted MOS structures and their use as light emittersin potential applications. It describes the structural formation processes inthe gate oxide during fabrication and under operation, how this microstructure development will affect the electrical device performance and how both microstructure and electrical characteristics determine the optoelectronic featuresof the light emitters. However, most of the discussed physical processes as well as the described fabrication methods and device characterization techniques are of general interest and are beyond the scope of this type of light emitter. The book will be of value to engineers, physicists, and scientists dealingeither with Si based photonics in particular or optoelectronic device fabrication and characterization in general. Summarizes the current knowledge in implanted rare earth materials Includes structural microelectric device aspects A reference work for researchers and engineers alike INDICE: Introduction.- Si-based Light Emitters.- Microstructure.- Electrical Properties.- Electroluminescence Spectra.- Electroluminescence Efficiency.-Stability and Degradation.- Applications.

• ISBN: 978-3-642-14446-2
• Editorial: Springer
• Encuadernacion: Cartoné
• Páginas: 220
• Fecha Publicación: 01/10/2010
• Nº Volúmenes: 1
• Idioma: Inglés