Advanced characterization techniques for thin film solar cells

INDICE: I Introduction 1. Introduction to thin-film photovoltaics II Devicecharacterization 2. Fundamental electrical characterization of thin-film solar cells 3. Electroluminescence analysis of thin-film solar modules 4. Capacitance spectroscopy of thin-film solar cells III Materials characterization 5. Characterizing the light trapping properties of textured surfaces with scanning near-field optical microscopy 6. Ellipsometry 7. Photoluminescence analysis ofSi and chalcopyrite-type thin films for solar cells 8. Steady state photocarrier grating method 9. Time-of-flight analysis 10. Electron Spin Resonance on Si thin films for solar cells 11. Scanning probe microscopy on thin films for solar cells 12. Electron microscopy on thin films for solar cells 13. X-ray andneutron diffraction of materials for thin film solar cells 14. Raman Spectroscopy on thin films for solar cells 15. Soft x-ray and electron spectroscopy: aunique 'tool chest' to characterize the chemical and electronic properties ofsurfaces and interfaces 16. Elemental distribution profiling of thin films for solar cells 17. Hydrogen effusion experiments IV Materials and device modelling 18. Ab-initio modelling of semiconductors 19. One-dimensional electro-optical simulations of thin film solar cells 20. Two-dimensional electrical simulations of thin film solar cells

• ISBN: 978-3-527-41003-3
• Editorial: Wiley-VCH
• Encuadernacion: Cartoné
• Páginas: 586
• Fecha Publicación: 09/03/2011
• Nº Volúmenes: 1
• Idioma: Inglés