Design, analysis and test of logic circuits underuncertainty

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approachthe limits of CMOS scaling. Ensuring the reliability of such circuits despitethe probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior. INDICE: Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary andExtensions.

• ISBN: 978-90-481-9643-2
• Editorial: Springer
• Encuadernacion: Cartoné
• Fecha Publicación: 31/08/2012
• Nº Volúmenes: 1
• Idioma: Inglés