Coherent Electron Microscopy: Designing faster and brighter electron sources
Hawkes, Peter W.
Hÿtch, Martin
Advances in Imaging and Electron Physics, Volume 225 in the Advances in Imaging and Electron Physics serial, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series INDICE: Preface Martin Hÿtch and Peter Hawkes 1. Characterization of nanomaterials properties using FE-TEM Florent Houdellier 2. Cold field-emission electron sources: from higher brightness to ultrafast beams Florent Houdellier 3. Every electron counts : towards the development of aberration optimized and aberration corrected electron sources Florent Houdellier
- ISBN: 978-0-443-19324-8
- Editorial: Academic Press
- Encuadernacion: Cartoné
- Páginas: 232
- Fecha Publicación: 01/04/2023
- Nº Volúmenes: 1
- Idioma: Inglés