Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contains contributions from leading authorities on imaging and electron physics that inform and update on the latest developments in the fieldProvides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing INDICE: 1. Particle interference and diffraction Roman Castañeda 2. Unified formalism of modal methods in computational electromagnetics and latest advances: applications in nanophotonics and plasmonics Kofi Edee 3. Transmission Electron Microscopy: Emerging Investigations for Cultural Heritage Materials Philippe Sciau
- ISBN: 978-0-12-804811-5
- Editorial: Academic Press
- Encuadernacion: Cartoné
- Páginas: 232
- Fecha Publicación: 01/10/2016
- Nº Volúmenes: 1
- Idioma: Inglés