New methods of concurrent checking

Written by a team of two leading experts and two very successful young formerPhD students, New Methods of Concurrent Checking describes new methods of concurrent checking, such as partial duplication, use of output dependencies, complementary circuits, self-dual parity, self-dual duplication and others. A special chapter demonstrates how the new general methods of concurrent checking can be more specifically applied to regular structures to obtain optimum results. This is exemplified for all types of adders up to 64 bits with a level of detail never before presented in the literature. The clearly written text is illustrated by about 100 figures. New Methods of Concurrent Checking is approvedin many university courses for graduate and undergraduate students, and it isof interest to students and teachers in electrical engineering and computer science, researchers and designers and all readers who are interested in the design and the understanding of reliable circuits and computers. Of great importance for the emerging nanotechnologies with their increasing numbers of transient faults Shows in a systematic way how the best possible state-of-the-art digital error detection circuits can be designed Only book which describes the most important methods of concurrent checking developed in the last 15 years INDICE: From the contents 1 Introduction. 2 Physical Faults and FunctionalErrors. 3 Principles of Concurrent Checking. 4. Concurrent Checking for the Adders. References. Index.

• ISBN: 978-1-4020-8419-5
• Editorial: Springer
• Encuadernacion: Cartoné
• Páginas: 200
• Fecha Publicación: 01/05/2008
• Nº Volúmenes: 1
• Idioma: Inglés