Analysis and design of resilient VLSI circuits: mitigating soft errors and process variations

This book describes the design of resilient VLSI circuits. VLSI design has become more challenging recently, due to the detrimental effects of radiation particle strikes and processing variations. This book presents algorithms to analyze the effects of these issues on the electrical behavior of VLSI circuits and circuit design techniques to mitigate the impact of these problems. Describes the state of the art in the areas of radiation tolerance circuit design andprocess variation tolerant circuit design Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers

• ISBN: 978-1-4419-0930-5
• Editorial: Springer
• Encuadernacion: Cartoné
• Páginas: 240
• Fecha Publicación: 01/11/2009
• Nº Volúmenes: 1
• Idioma: Inglés