Microstructural Characterization of Radiation Effects in Nuclear Materials

Microstructural Characterization of Radiation Effects in Nuclear Materials

Edmondson, Philip

239,20 €(IVA inc.)

Microstructural Characterization of Radiation Effects in Nuclear Materials provides an overview into experimental techniques that can be used to examine those effects (both neutron and charged particle) and can be used by researchers, technicians or students as a tool to introduce them to the various techniques. The need to examine the effect of radiation on materials is becoming increasingly important as nuclear energy is emerging as a growing source of renewable energy. The book opens with a discussion of why it is important to study the effects of radiation on materials and looks at current and future reactor designs and the various constraints faced by materials as a result of those designs. The book also includes an overview of the radiation damage mechanisms. The next section explores the various methods for characterizing damage including transmission electron microscopy, scanning transmission electron microscopy, analytical electron microscopy, electron backscatter diffraction, atom probe tomography, X-ray scattering techniques and ion beam analysis techniques. Lastly, a brief introduction into modelling radiation effects in materials, and the synergy of experiments and modelling to provide an atomic-scale to macro-scale understanding of damage processes is included. Focuses on structural analysis techniques, describing their instrumentation, and introduces specific case studies showcasing the techniquesCovers the fundamental aspects of TEM as well as the specific aspects of radiation damageDiscusses the characterization of real materials systems that have been neutron irradiatedEncompasses sample preparation and statistical analysis into the individual technique chaptersWritten by well-known experts in the field of materials characterization INDICE: 1. Introduction 2. Principles of Radiation Damage Mechanisms 3. Transmission Electron Microscopy 4. Scanning Transition Electron Microscopy 5. Analytical Electron Microscopy 6. Atom Probe Tomography 7. X-Ray Scattering Techniques 8. Ion Beam Analysis Techniques 9. Comments on Multiscale Modeling of Radiation Effects in Nuclear Materials

  • ISBN: 978-0-12-805316-4
  • Editorial: Butterworth-Heinemann
  • Encuadernacion: Rústica
  • Páginas: 736
  • Fecha Publicación: 01/09/2017
  • Nº Volúmenes: 1
  • Idioma: Inglés