Reliability, availability and serviceability of networks-on-chip

This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures. Provides state-of-the-art research on the challenges to test, diagnose and tolerate faults in NoC-based systems. Includes numerous, current test strategies, including re-use of the network for core testing, test scheduling for the NoC reuse, test access methods and interface, efficient re-use of the network, and power-aware and thermal-aware NoC-based SoC testing. Offers a single source reference to the latest research, otherwise available only in disparate journals and conference proceedings. INDICE: Introduction. NoC Basics. Systems-on-Chip Testing. NoC Reuse for SoC Modular Testing. Advanced Approaches for NoC Reuse. Test and Diagnosis of Routers. Test and Diagnosis of Communication Channels. Error Control Coding andRetransmission. Error Location and Reconfiguration. Concluding Remarks.

• ISBN: 978-1-4614-0790-4
• Editorial: Springer US
• Encuadernacion: Cartoné
• Páginas: 220
• Fecha Publicación: 28/10/2011
• Nº Volúmenes: 1
• Idioma: Inglés