Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventorReviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devicesAnalyzes key insights on semiconductor materials and device physics derived from the SNDM technique INDICE: 1. Principle scanning nonlinear dielectric microscopy (SNDM) for ferroelectric or dielectric polarization2. Ferroelectric polarization measurement3. Ultra-high density ferroelectric data storage based on SNDM4. Linear permittivity measurement by SNDM5. Non-contact SNDM (NC-SNDM)6. Scanning nonlinear dielectric potentiometory (SNDP) for measurement of the potential induced by the atomic dipole moment7. Principle of SNDM for semiconductor measurement8. Carrier distribution measurement in semiconductor materials and devices9. Super-higher-order SNDM (SHO-SNDM) 10. Local deep level transient spectroscopy (Local DLTS)11. Time resolved SNDM (Tr-SNDM)

• ISBN: 978-0-12-817246-9
• Editorial: Woodhead Publishing
• Encuadernacion: Rústica
• Páginas: 500
• Fecha Publicación: 01/06/2020
• Nº Volúmenes: 1
• Idioma: Inglés