FinFET/GAA Modeling for IC Simulation and Design: Using the BSIM-CMG Standard
Chauhan, Yogesh Singh
Pahwa, Girish
Dasgupta, Avirup
Lu, Darsen Duane
Venugopalan, Sriramkumar
Khandelwal, Sourabh
Duarte, Juan Pablo
Paydavosi, Navid
Niknejad, Ai
Hu, Chenming
FinFET/GAA Modeling for IC Simulation and Design: Using the BSIM-CMG Standard is the first to explain FinFET modeling for IC simulation and the industry standard - BSIM-CMG - describing the rush in demand for advancing the technology from planar to 3D architecture, as now enabled by the approved industry standard. The book gives a strong foundation on the physics and operation of FinFET, details aspects of the BSIM-CMG model such as surface potential, charge and current calculations, and includes a dedicated chapter on parameter extraction procedures, providing a step-by-step approach for the efficient extraction of model parameters. With this book you will learn: Why you should use FinFET The physics and operation of FinFET Details of the FinFET standard model (BSIM-CMG) Parameter extraction in BSIM-CMG FinFET circuit design and simulation Authored by the lead inventor and developer of FinFET, and developers of the BSIM-CM standard model, providing an experts' insight into the specifications of the standard The first book on the industry-standard FinFET model - BSIM-CMG New to this edition: A new chapter giving a comprehensive introduction to GAA in chapter-1 - the motivation, device concept, structure, fabrication steps, benefits, and the industry standard GAA model All the chapters updated to include the recent development in the BSIM-CMG model Updated the RF modeling of FinFET using BSIM-CMG model including parameter extraction A new chapter on Cryogenic modelling INDICE: 1. Gate-All-Around FET model2. Cryogenic Temperature Model3. FinFET- from Device Concept to Standard Compact Model4. Analog/RF behavior of FinFET5. Core Model for FinFETs6. Channel Current and Real Device Effects7. Leakage Current Models8. Charge, Capacitance and Nonquasi-Static Effect9. Parasitic Resistances and Capacitances10. Noise11. Junction Diode Current and Capacitance12. Benchmark tests for Compact Models13. BSIM-CMG Model Parameter Extraction14. Temperature Effects
- ISBN: 978-0-323-95729-8
- Editorial: Academic Press
- Encuadernacion: Rústica
- Páginas: 350
- Fecha Publicación: 01/06/2023
- Nº Volúmenes: 1
- Idioma: Inglés