This advanced textbook describes the fundamentals of electrical measurements on semiconductor interfaces and the importance of controlling macroscopic electrical properties by atomic-scale techniques. It covers geometric, chemical, and electronic structure of electronic materials, and their applications to devices based on semiconductor surfaces, metal-semiconductor interfaces, and semiconductor heterojunctions. General reading lists, extensive citations to the text, and problem sets are appended to all chapters.Leonard Brillson is a professor of Electrical & Computer Engineering, Physics, and Center for Materials Research Scholar at The Ohio State University in Columbus, OH, USA. Prior to that, he was director of Xerox Corporation's Materials Research Laboratory and had responsibility for Xerox's long-range physical science and technology programs at the company's research headquarters in Rochester, N.Y. He is a Fellow of IEEE, AAAS, AVS, and APS, and a former GoverningBoard member of the American Institute of Physics. He has authored over 300 scientific publications and received numerous scientific awards, including the AVS Gaede-Langmuir Award.
- ISBN: 978-3-527-40915-0
- Editorial: Wiley-VCH
- Encuadernacion: Cartoné
- Páginas: 586
- Fecha Publicación: 10/03/2010
- Nº Volúmenes: 1
- Idioma: Inglés