Lock-in thermography: basics and use for evaluating electronic devices and materials

This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermalLIT lifetime mapping. Typical LIT investigation case studies are introduced. INDICE: Introduction.- Physical and Technical Basics.- Timing Strategies.-Heat Dissipation Mechanisms in Solar Cells.- Carrier Density Imaging.- Illuminated Lock-in Thermography (ILIT).- Experimental Technique.- Theory.- Measurement Strategies.- Typical Applications.- Summary and Outlook

• ISBN: 978-3-642-02416-0
• Editorial: Springer
• Encuadernacion: Cartoné
• Páginas: 255
• Fecha Publicación: 01/01/2010
• Nº Volúmenes: 1
• Idioma: Inglés