Sample preparation handbook for transmission electron microscopy: methodology

This comprehensive guide to sample preparation for the transmission electron microscope is divided into two main sections. The first covers theoretical andpractical aspects, including the best preparative technique taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the mainartefacts brought about by mechanical, physical and chemical methods. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. The remainder of the book is dedicated to technical hints, including 22 detailed protocols for preparing thin slices for TEM analysis. Experimental conditions and guidelines, options and variations, advantages and constraints, common artefacts, and theoretical issues are considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. Finally, a practical, authoritative, and interdisciplinary handbook is available to guide you through all of the most current techniques for successful sample preparation in all fields from materials science to biology. First book on TEM sample preparation to combine all the most current techniques for applications ranging from mineralsto biological materials Compares techniques in terms of their limitations, artefacts, application areas, and types of analysis (macroscopic, atomic, or molecular level) Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Complementary interactive database website is available to scientists worldwide INDICE: Introduction to materials.- The different observation modes in electron microscopy (SEM, TEM, STEM).- Materials problems and approaches for TEM and TEM/STEM analyses.- Physical and chemical mechanisms of preparation techniques.- Artifacts in transmission electron microscopy.- Selection of preparation techniques based on materials problems and TEM analyses.- Comparisons between techniques.-

• ISBN: 978-0-387-98181-9
• Editorial: Springer
• Encuadernacion: Cartoné
• Páginas: 272
• Fecha Publicación: 01/06/2010
• Nº Volúmenes: 1
• Idioma: Inglés